FEI Tecnai F20

Foto: MPI-P

The FEI Tecnai F20 F TEM at the MPI for Polymer Research is operated with 200 kV and can be used for many high-end issues. The twin objective lens makes it possible to choose between necessary resolution and adequate contrast. It is equipped with a scanning unit (STEM) including a high angle annular dark field (HAADF) detector. With this configuration, it is suitable for a wide range of electron microscopic techniques, such as electron energy loss spectroscopy (EELS) , the energy- filtered imaging (EFTEM) and energy dispersive X- dispersive spectroscopy (EDS or EDX). In addition, both simple and tomographic Cryo-TEM micrographs are possible .

Beschleunigungsspannung:200 kV
Emitter:Schottky FEG
Spezifizierte Punktauflösung:0.24 nm
Spezifizierte Linienauflösung:0.144 nm
Kamera:on axis Gatan US1000 2k CCD camera
Energiefilter:post-column Gatan Tridiem 863 with US1000 camera
Dunkelfelddetektor:Fishione HAADF
Spezifizierte STEM-Auflösung:0.34 nm
EDS Detektor:EDAX
Zubehör:zurückziehbare Gatan Cryo Platten
Probenhalter:Einfachkippung, Tomographie, Doppelkippung-Untergrundreduziert (EDX), Cryotransfer