Foto: MPI-P
The FEI Tecnai F20 F TEM at the MPI for Polymer Research is operated with 200 kV and can be used for many high-end issues. The twin objective lens makes it possible to choose between necessary resolution and adequate contrast. It is equipped with a scanning unit (STEM) including a high angle annular dark field (HAADF) detector. With this configuration, it is suitable for a wide range of electron microscopic techniques, such as electron energy loss spectroscopy (EELS) , the energy- filtered imaging (EFTEM) and energy dispersive X- dispersive spectroscopy (EDS or EDX). In addition, both simple and tomographic Cryo-TEM micrographs are possible .
| Beschleunigungsspannung: | 200 kV |
| Emitter: | Schottky FEG |
| Spezifizierte Punktauflösung: | 0.24 nm |
| Spezifizierte Linienauflösung: | 0.144 nm |
| Kamera: | on axis Gatan US1000 2k CCD camera |
| Energiefilter: | post-column Gatan Tridiem 863 with US1000 camera |
| Rastereinheit: | FEI |
| Dunkelfelddetektor: | Fishione HAADF |
| Spezifizierte STEM-Auflösung: | 0.34 nm |
| EDS Detektor: | EDAX |
| Zubehör: | zurückziehbare Gatan Cryo Platten |
| Probenhalter: | Einfachkippung, Tomographie, Doppelkippung-Untergrundreduziert (EDX), Cryotransfer |