A wide range of methods can be carried out on the instruments of the EMC-M. Background material for understanding these methods is provided under "Teaching".
Imaging
- Transmission electron microscopy (TEM)
- Scanning transmission electron microscopy (STEM)
- High-resolution transmission electron microscopy (HRTEM)
- Real-space tomography
- Scanning electron microscopy (SEM)
- Low-voltage SEM (low-kV SEM)
- Backscattered-electron (BSE) imaging
Elemental analysis
- Energy-dispersive X-ray spectroscopy (EDX)
- Electron energy-loss spectroscopy (EELS)
Diffraction
- Selected-area electron diffraction (SAED)
- Nanobeam electron diffraction (NED)
- Automated Diffraction Tomography (ADT) = reciprocal-space tomography
- Electron-beam precession technique (PED)
- Electron backscatter diffraction (EBSD)
Data processing
- Tomographic reconstruction
- Dynamical diffraction calculations